The Industry's Only Cleanliness Testing System Capable of Determining:
   - Volume of Contamination
   - Location of Contamination
   - Identification of Contamination
 

Prerecorded Presentation
Available 24/7

Request more informationExecutive Summary: C3 Purpose & Operation
How Clean is this Spot?
Localized White Residues on Assembly

The C3 ionic cleanliness tester is unique from other contamination testers on the market.  It is the first tester to examine contamination in a localized area of a PCB assembly.  By looking at a localized area of 0.1 in², the C3 ionic cleanliness tester provides immediate feedback as to whether or not the area is ionically 'clean' or 'dirty'.  The localized testing format of the C3 allows users to look at specific components or areas of circuitry that are particularly sensitive and prone to performance issues.

By using the C3 Tester on your production floor, the presence of conductive or corrosive residues can be detected quickly and effectively.  The system is designed for efficiency and to provide the immediate process monitoring data that an off-site testing facility cannot.  With a user-friendly touch-screen, the C3 pinpoints the problem areas that need further analysis.  When further analysis is needed, users can send off the sample collected by the C3 for further testing to determine exactly what contaminants are present.

C3 is the only cleanliness testing method capable of determining where a contaminant is, the level of contamination, and what the contamination is.  C3 collects and stores samples of the extracted contaminant. The stored sample may be sent to the Forsite laboratory for identification via Ion Chromatography (for an added fee).

Articles & Cases About the C3 Tester

Executive Summary: C3 Purpose & Operation
How Clean is this Spot?
Localized White Residues on Assembly

> Request more information

> Back to Home